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X-ray diffraction services offered by the University of Neuchâtel and the XRD Application Laboratory, CSEM

 

 

   

X-Ray Diffraction Service
Neuchâtel

 
 

 

 

 

 

 

 

Single Crystal X-ray Diffraction Analysis

University of Neuchâtel

NPAC 

See - Unité de Cristallographie

Contact:
Prof. Assoc.
Bruno Therrien

bruno.therrien@unine.ch










Study of surface structures

  • High resolution X-ray diffraction (HR-XRD)
  • Phase identification and analysis
  • Study of lattice strain and texture
  • Study of composition and relaxation (reciprocal space mapping)
  • Reflectivity measurements (layer density and thickness, interface roughness)
  • In-plane diffraction (in-plane texture, lateral grain size)
    → study of multi-layered materials:
    • semi-conductors
    • magnetic materials
    • coatings

Contact:
CSEM
Dr. Olha Sereda
olha.sereda@csem.ch

 
 
 

 
 

 


  • High resolution data collection for microcrystalline samples (pure or mixed phases) including phase analysis
  • Molecular structure determination of microcrystalline pure phases
  • Particle size determination
  • Study of Polymorphism

Contact:
CSEM
Dr. Olha Sereda
olha.sereda@csem.ch